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Handheld XRF Analyzer

Handheld XRF Analyzer X-MET 5000

Engineered for high performance and reliability, this hand-held XRF analyser combines Oxford Instruments’ patented PentaPIN® detector technology offering guaranteed fast analysis and lower limits of detection for all elements of interest.

Built for the most demanding quality control applications:

  • scrap metal sorting - analysis of metals for PMI - consumer products for RoHS screening - lead in toys  compliance testing - ore exploration in mining processes - heavy metal monitoring in soils  

The X-MET5000’s major strength is the Light Element Treatment (LET) mode, enabling fast and accurate analysis of heavy elements, even when the sample contains light elements like Aluminum and Silicon. This is not possible when using fundamental parameters (FP) on an analyser that does not detect light elements.

This rugged and reliable tool is IP54 (NEMA 3) approved for superior dust and splash protection.
The X-MET5000 is perfect for the harshest environments. The battery's operating time of one working day is unique and enables extended productivity without returning to base. 

The powerful user programmable software delivers highly accurate results for reliable Go/No-Go decisions.
The X-MET5000 will identify material type and automatically choose the best XRF analysis method. 

  • Scrap   
  • PMI inspection 
  • RoHS testing 
  • Lead in Toys 
  • Mining and Soils 

The current high prices of commodities metal, in particular Nickel, make the accurate determination of alloy composition critical in the financial success of modern recycling operations. 

The X-MET5000 quickly and accurately measures Nickel even in concentrations below 1%.  The same instrument can be loaded with both a metals analysis program and plastic analysis program making it ideal for the growing scope of the recycling industry.  An analytical program for precious metals analysis is also available. 

The X-MET5000’s major strength is the Light Element Treatment (LET) mode, enabling fast and accurate analysis of the matrix elements even when the sample contains light elements like Aluminum and Silicon. This is not possible when using Fundamental Parameters (FP) on an analyser that does not detect the light elements.

 





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