XRF

X-ray XRF

Oxford Instruments X-Strata980 for analysis of trace elements and coating thickness

Combining a high power X-ray tube and high resolution detector, the X-Strata980

X-ray Fluorescence analyzer delivers limits of detection in single digit ppms!

100W X-ray tube and 25mm2 Peltier cooled PIN detector
Multiple collimators
Simultaneous analysis of thickness and composition
Mapping software
Combined calibration method
Color-coded pass/fail results
Giant chamber

Additional Benefits

Measure small areas of a complex sample and deliver superior limits of detection.
Detect hazardous elements in single digit ppms assuring production of an environmentally friendly product and saving costly recalls or enforcements of regulatory legislation.
Perform analysis and characterization of multi-layer coatings, SAC alloys, µPPF and solar panels.
Choose the best calibration method for your application - empirical or fundamental parameter calibration or a combination of both.
Generate detailed reports to show due-diligence when testing for hazardous elements in consumer goods.

Key Applications

Trace analysis of hazardous substances
Solder alloy analysis
Coating thickness measurement of gold and palladium on electronics
Metal alloy chemistry identification
Coating thickness measurement on jewelry

Oxford Instruments CMI 900 for Measurement of Coating Thickness and Material Composition

CMI 900 Series systems are designed to provide years of trouble free and accurate measurements. Whether your interest is plating thickness, material composition, karat content, multiple layers, or liquid analysis, this is the system we recommend.
CMI900 offers a range of configurations in an easy to use, compact instrument.
*XYZ programmable
*Manual
*Slotted chamber
*Large sample chamber